July 2015 Newsletter
"3D Flex Vision"
High-speed ball/bump inspection system for turret handlers
Cohu innovates once again, this time with a new line of machine vision technology. We are pleased to announce the market release of the new “3D Flex” Vision, the first high speed (up to 30K uph) 3D ball/bump inspection system that is fully integrated into your turret handlers.
Based on light phase shifting technology, moiré interferometry, the system combines a sequence of touchless 2D images with light pattern projection to generate a topographic 3D view of inspected devices.
This solution is ideal for inspecting small BGAs, CSPs, and bumped dies. It measures ball height, 3D coplanarity as well as regular 2D measurements: ball diameter, pitch and location. This is a touch-less (without any contact of the device) technology. The 3D Flex inspection system is part of Cohu’s NVcore Vision architecture.
Cohu ITS offers a wide range of pogo pin contactors for BGA and WLP packages. Our Philippines team provides design and manufacturing of precision spring probe contactors.
Our solutions address several market requirements, including that of microcontroller IC test with 2,500+ pins with contact pitch down to 0.3 mm.
We also offer a variety of Kelvin solutions for BGAs and WLPs with offset pins for spring probes. We can also accommodate custom or specified spring probes.
Depending on the handler platform — Test-in-Strip, Turret, Pick-and-Place or Gravity Feed — the contactor is optimized to assure an excellent temperature accuracy of the device under test from -55°C to 175°C.
Additional features are available to assure reliable heat transmission and precise device alignment in the contactor. The Cohu ITS pogo pin portfolio covers contactor solutions for WLPs, BGAs, LGAs, QFNs, DFNs, QFPs and SO devices.
Boost your Yield!
Cohu has added the Yield Booster* to its Gravity Feed Handlers
The Yield Booster option provides a significant reduction of the contact resistance and assures that it remains stable through test. This technology uses an electro-mechanical process that reduces pin contamination and cleaning cycles, extending the lifetime of the pins.
This Yield Booster is currently available for the SO1000 and SO2000 Gravity Feed Handlers, with other handler platforms available soon.
Field data of Yield Booster Benefits
- 2 - 5% Yield improvement
- Very low and consistent contact resistance
- Higher first pass yield
- Reduced re-test
- Approximately 8% improved handler uptime, fewer cleaning cycles and reduced contactor maintenance interventions.
- 10% reduced contactor spare part consumption per year due to extended pin lifetime.
- The Yield Booster option is the only available solution which enables test of analog products with extreme low CRES requirements.
2015 BiTS Workshop a Success
Cohu had a big presence at The Burn-in and Test Strategies (BiTS) Workshop held in March 2015. Cohu’s Markus Wagner, Manager, Contactor Engineering presented “Contacting Solutions for High Power Bare Die Testing (IGBT and Diodes).”
Additionally, Cohu showcased their line of integrated Contactor Solutions for Turret, Gravity, Pick-and-Place and Test-in-Strip Handlers.