Semiconductor Tester Solutions for Power Management
Conserve, control, and maximize.
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Cohu Tester Experience
- Long history of testing power management devices across multiple markets
- Focused instrumentation dedicated to providing high throughput
Applications
- Broad range of PMIC devices
- Automotive/industrial/battery management
Test System Solutions
Diamondx Test System
Flexible, Cost Optimized Test Solutions for the Most Challenging Applications
Diamondx test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost driver’s IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.
Breakthrough cost reductions in both capital and operating costs for the automotive, mobility, IoT/IoV/Optoelectronics, industrial and medical, and consumer markets.
Proven capability in high-density digital, DC, analog instruments as well as technology leading precision analog, SerDes, RF and Automotive test makes the Diamondx test system suitable for today’s broad range of devices.
Diamondx DxV Test System
Changes the Rules of Design Through to Production Test
The Diamondx DxV provides full semiconductor ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor ATE solutions that is no mainframe, separate workstation or support cabinets needed. The DxV is completely stand-alone, so it can be placed on a bench or desktop:
- Ultra-compact, small footprint, light weight, single box design
- Air-cooled with low ambient noise for an office environment
- Energy-efficient, low power consumption
- Ideal for lab development and high-volume production
Instrumentation Solutions
AWG
High Resolution Arbitrary Waveform Generator
- 2 channels per board
- 256K words of memory per channel
- 26 bits resolution
- THG greater than 100dB
DCTMx
Precision Data Converter Test Module
- Precision linearity to 1 ppm
- Single-ended, differential, and pseudo-differential connection
- Testing ADCs and DACs, and class-D amplifiers with a single instrument
DIG-HSB
High Speed Waveform Digitizer
- Dual channel, 14 Bit, 105 MSPS waveform digitizer
- Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance.
- Offers an analog bandwidth greater than 150 MHz
DPIN96
High-Value Solution for Testing Digital and Mixed-Signal Devices
- Flexible timing
- Reconfigurable pattern memory
- Deep capture memory
- High-precision PMU
- Built-in time measurement
- Super voltage
- Comprehensive software tools
FPVIx
High Voltage, High Current Floating Programmable Power Supply
- Fast throughput with high power pulsed mode operation
- Transient detect capability to capture perturbations at the device in program development, or production test
- Reduced loadboard complexity using the SmartMux for high voltage and current signal routing
- Expert mode to maximize energy efficiency of the instrument
FX Digital
32 Channel Digital Instrument
- Fully independent programming of timing and level on every channel
- Synchronization signaling to/from other instruments
- Read/Write memory for generating digital protocols used in RF front end applications
- Multi-site programming model
- Full pattern sequencing at 200 Mbps
HDVI
High Density Voltage Current Instrument for Massive Multisite Test
- Highest V/I pin density in the industry
- Voltage/current supply (VIS) mode
- Precision analog source (PAS) mode
- Flexible triggering options
- External input matrix
HPVIx
High Power Voltage/Current Programmable Power Source
- Fast throughput with high power pulsed mode operation
- Transient detect capability to capture perturbations at the device in program development, or production test
- Reduced loadboard complexity using the SmartMux for high voltage and current signal routing
Multiwave
Highly Integrated Mixed-Signal Instrument for Multisite and Concurrent Testing
- Wide bandwidth analog source
- Wide bandwidth analog capture
- Flexible triggering
- High-precision PMU
- Protected I/O channels
- Simpler test boards
- Mixed-signal software support
PMVIx
Voltage/Current Source for Mobile Power Management, SOC, Automotive and MCU ICs
- Meets the test challenges of integrated mobile power management devices with dozens of DC-DC and linear regulators ranging from under 100 mA to several amps.
QTMP
Quad time measurement processor
- Four independent time measurement channels per board
- Each channel has its own direct path to DUT which can be programmed over 3 voltage ranges and 3 selectable filters
VI1x
Precision Voltage/Current Source and Measurement with Advanced Features for Automotive and Industrial devices
- Advanced features such as a modulation generator and digitizer per channel enable the VI1x to be used for a wide variety of devices measurements
- A combination of internal and external triggers can be used for gating and sampling for maximum testing flexibility
- A time measurement unit measures rise and fall times, pulse, period, frequency and time difference, making the VI1x a truly versatile instrument
VIS16
Precision voltage/current source and measurement with advanced features
- Four Quadrant VI Source/Measure
- Ganging capability for extended current range
- 4:1 SmartMux
- Differential Vmeas
- +/-20 V / 300 mA, +/- 60 V / 100 Ma
- AWG and Digitizer Functions
VSX
Extended Range Voltage Source
- 4 channels per board
- Force voltage to 1250V
- 10mA current source
XVI
14 Channel DC Instrument
- ±0V, ±100mA, 150mA pulsed
- Voltage force and measure accuracy: 0.03% of range
- Current force and measure accuracy: ±(0.05% of range +5nA +0.002% range / V)
- Differentatial measurement using two channels
- Increased multisite scalability
Expertise
Learn more about our Semiconductor Tester Solutions.
