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Turret Test and Scan

Turret platforms for semiconductor test, inspection and packaging

Cohu NY20 Turret Test and Scan HandlerIsmeca NY20

Highest Throughput for Fragile Devices
20-position turret platform for semiconductor test, inspection and packaging.

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Cohu NY32 Turret Test and Scan HandlerIsmeca NY32

Highest Demanding Finishing Processes
32-position turret platform for semiconductor test, inspection and packaging.

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Cohu Ismeca NY32W Turret and Inspection Test HandlerIsmeca NY32W

Flexible Test and Scan Solution for FFC Devices
32-position turret platform for semiconductors on film-frame wafer media.

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Cohu Neon WLCSP InspectionNeon

Market Leading Inspection Yield with Uncompromised Throughput
Next generation inspection platform optmized for small, fragile semiconductors used in mobility and consumer applications

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Expertise

Learn more about our Test Handler Solutions