Tray to Tray and Tray to Tape

Krypton is a full 6-sided inspection & metrology system for high-end semiconductor packages, based on its unique racetrack architecture combined with Cohu’s sophisticated NV-Core vision technology, it delivers state-of-the-art inspection with up to 30% higher throughput and uptime compared to existing solutions.

The systems disruptive closed-loop racetrack architecture delivers high productivity through fast sorting, automatic yield recovery and direct sort of good and defective device without impact on production throughput. Automatic second pass enables defective device re-inspection capability to optimize yield gain. Krypton saves IC device manufacturers’ inspection & metrology equipment 30% in capital expenses by inspecting, measuring, and sorting packages efficiently and enabling automatic re-inspection capability to optimize yield gain.

Krypton also features Cohu’s DI-Core Data Intelligence System providing real-time equipment monitoring and data analytics for Industry 4.0/Factory Automation, to significantly improve overall equipment efficiency, increase inspection yield, and maximize device output per machine.